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    Sensitivity and lift-off robustness of magnetic resonance circuit topologies for enhanced WPT-based ECT systems

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    Authors
    Daura, Lawal Umar
    Sun, Yichuang
    Tian, Gui Yun
    Ibrahim, Emmanuel Tashiwa
    Roopak, Monika
    Yang, Changrong
    Issue Date
    2025-05-15
    Subjects
    wireless power transfer
    Principle Component Analysis (PCA)
    Singular Value Decomposition (SVD)
    
    Metadata
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    Abstract
    Electromagnetic sensors’ response is affected by lift-off variations, which are caused by nonmagnetic coating thickness, surface roughness, or sensor vibrations. These variations affect eddy current testing (ECT) sensitivity, defect quantification, and reconstruction of material properties. This article compares different magnetic resonance circuit (MRC) topologies as signal conditioning for improving the ECT system’s response to various lift-offs. The MRC is designed to operate at maximum energy, with the potential of several resonances, which lead to enhanced response for optimal and multiple feature extraction, improving signal-to-noise ratio (SNR) and increasing sensitivity to cracks. The proposed paper designs and investigates the effect of different MRC topologies connected to ECT systems to inspect a steel block with surface cracks. The performance comparison of the proposed systems provides the advantages and limitations of different MRC approaches for multiple resonance potentials, higher SNR, and response sensitivity at different lift-off distances. The advanced MRC, featuring series and shunt topologies in each transmit and receive coil, is the most immune to noise, with an SNR of 49.9 dB at a 3.4 mm lift-off using its first peak frequency feature. Its response is less crack-sensitive, with a sensitivity of up to 1.5% at 0.6 mm lift-off.
    Citation
    Daura LU, Sun Y, Tian GY, Ibrahim ET, Roopak M, Yang C (2025) 'Sensitivity and lift-off robustness of magnetic resonance circuit topologies for enhanced WPT-based ECT systems', IEEE Sensors Journal, 25 (13), pp.24568-24578.
    Publisher
    IEEE
    Journal
    IEEE Sensors Journal
    URI
    http://hdl.handle.net/10547/626738
    DOI
    10.1109/JSEN.2025.3568699
    Additional Links
    https://ieeexplore.ieee.org/abstract/document/11005655
    Type
    Article
    Language
    en
    ISSN
    1530-437X
    ae974a485f413a2113503eed53cd6c53
    10.1109/JSEN.2025.3568699
    Scopus Count
    Collections
    Computing

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