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dc.contributor.authorCao, Liang
dc.contributor.authorLiu, Ri
dc.contributor.authorZhang, Wenxiao
dc.contributor.authorWang, Ying
dc.contributor.authorWang, Guoliang
dc.contributor.authorSong, Zhengxun
dc.contributor.authorWeng, Zhankun
dc.contributor.authorWang, Zuobin
dc.date.accessioned2022-11-21T12:02:25Z
dc.date.available2022-11-21T12:02:25Z
dc.date.issued2022-01-29
dc.identifier.citationCao L, Liu R, Zhang W, Wang Y, Wang G, Song Z, Weng Z, Wang Z (2022) 'High-reliability graphene-wrapped nanoprobes for scanning probe microscopy', Nanotechnology, 33 (5)en_US
dc.identifier.issn0957-4484
dc.identifier.doi10.1088/1361-6528/ac1630
dc.identifier.urihttp://hdl.handle.net/10547/625573
dc.description.abstractThe nanoprobe is a powerful tool in scanning probe microscopy (SPM) that is used to explore various fields of nanoscience. However, the tips can wear out very fast due to the low stability of conventional probes, especially after the measurement of high currents or lateral friction, which results in image distortion and test imprecision. Herein, a novel functional nanoprobe is presented using graphene sheets in a high-quality graphene solution wrapped round a plasma-treated conventional Pt-Ir coated nanoprobe, which shows highly stability and resistance to degradation, leading to a significantly increased lifetime. Furthermore, we show that the graphene-wrapped nanoprobes have the advantages of enhanced electrical conductivity and reduced tip–sample friction, compared with Pt-Ir coated nanoprobes. The simplicity and low cost of this method make it valuable to various functional graphene-wrapped nanoprobes and applications.en_US
dc.language.isoenen_US
dc.publisherIOP Publishingen_US
dc.relation.urlhttps://iopscience.iop.org/article/10.1088/1361-6528/ac1630en_US
dc.rightsGreen - can archive pre-print and post-print or publisher's version/PDF
dc.subjectnanoprobeen_US
dc.titleHigh-reliability graphene-wrapped nanoprobes for scanning probe microscopyen_US
dc.typeArticleen_US
dc.identifier.eissn1361-6528
dc.contributor.departmentChangchun University of Science and Technologyen_US
dc.contributor.departmentUniversity of Bedfordshireen_US
dc.identifier.journalNanotechnologyen_US
dc.date.updated2021-12-02T14:05:04Z
dc.description.notetesting import from WOSlite dec 2021


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