Direct imaging of IgE on the mica surface by tapping-mode atomic force microscopy
dc.contributor.author | Hu, Jing | |
dc.contributor.author | Wang, Ying | |
dc.contributor.author | Gao, Mingyan | |
dc.contributor.author | Song, Zhengxun | |
dc.contributor.author | Chen, Yujuan | |
dc.contributor.author | Wang, Zuobin | |
dc.date.accessioned | 2020-07-08T08:07:07Z | |
dc.date.available | 2020-07-08T08:07:07Z | |
dc.date.issued | 2020-02-02 | |
dc.identifier.citation | Hu J, Wang Y, Gao M, Song Z, Chen Y, Wang Z (2019) 'Direct imaging of IgE on the mica surface by tapping-mode atomic force microscopy', 2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Zhenjiang, IEEE. | en_US |
dc.identifier.issn | 2373-5422 | |
dc.identifier.doi | 10.1109/3M-NANO46308.2019.8947416 | |
dc.identifier.uri | http://hdl.handle.net/10547/624160 | |
dc.description.abstract | Immunoglobulin E (IgE) antibody is essential in the functioning of the immune system, so the study of IgE has its practical and profound significance. Herein, the effect of protein concentration and adsorption time on IgE morphology of mica surface was investigated. For this purpose, atomic force microscopy (AFM) has been performed for monitoring protein morphology at different concentrations and adsorption times. In addition, the height and average roughness of IgE were also obtained. The changes of IgE molecule morphology including the shape, height and average roughness indicated that the interactions of protein-surface and protein-protein were varying with the protein concentration and adsorption time. | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEEE | en_US |
dc.relation.url | https://ieeexplore.ieee.org/document/8947416 | en_US |
dc.subject | morphology | en_US |
dc.subject | immunoglobulin E | en_US |
dc.subject | atomic force microscopy | en_US |
dc.title | Direct imaging of IgE on the mica surface by tapping-mode atomic force microscopy | en_US |
dc.type | Conference papers, meetings and proceedings | en_US |
dc.contributor.department | Changchun University of Science and Technology | en_US |
dc.contributor.department | University of Bedfordshire | en_US |
dc.identifier.journal | 2017 IEEE INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO) | en_US |
dc.date.updated | 2020-07-08T08:00:16Z | |
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