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dc.contributor.authorHu, Jing
dc.contributor.authorWang, Ying
dc.contributor.authorGao, Mingyan
dc.contributor.authorSong, Zhengxun
dc.contributor.authorChen, Yujuan
dc.contributor.authorWang, Zuobin
dc.date.accessioned2020-07-08T08:07:07Z
dc.date.available2020-07-08T08:07:07Z
dc.date.issued2020-02-02
dc.identifier.citationHu J, Wang Y, Gao M, Song Z, Chen Y, Wang Z (2019) 'Direct imaging of IgE on the mica surface by tapping-mode atomic force microscopy', 2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Zhenjiang, IEEE.en_US
dc.identifier.issn2373-5422
dc.identifier.doi10.1109/3M-NANO46308.2019.8947416
dc.identifier.urihttp://hdl.handle.net/10547/624160
dc.description.abstractImmunoglobulin E (IgE) antibody is essential in the functioning of the immune system, so the study of IgE has its practical and profound significance. Herein, the effect of protein concentration and adsorption time on IgE morphology of mica surface was investigated. For this purpose, atomic force microscopy (AFM) has been performed for monitoring protein morphology at different concentrations and adsorption times. In addition, the height and average roughness of IgE were also obtained. The changes of IgE molecule morphology including the shape, height and average roughness indicated that the interactions of protein-surface and protein-protein were varying with the protein concentration and adsorption time.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.relation.urlhttps://ieeexplore.ieee.org/document/8947416en_US
dc.subjectmorphologyen_US
dc.subjectimmunoglobulin Een_US
dc.subjectatomic force microscopyen_US
dc.titleDirect imaging of IgE on the mica surface by tapping-mode atomic force microscopyen_US
dc.typeConference papers, meetings and proceedingsen_US
dc.contributor.departmentChangchun University of Science and Technologyen_US
dc.contributor.departmentUniversity of Bedfordshireen_US
dc.identifier.journal2017 IEEE INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO)en_US
dc.date.updated2020-07-08T08:00:16Z
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