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    Cleaning of contaminated MFM probes using a BOPP film and external magnetic field

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    Authors
    Zhang, Chao
    Liu, Jinyun
    Meng, Qing-Ling
    Zhang, Wenxiao
    Wang, Ying
    Li, Dayou
    Wang, Zuobin
    Affiliation
    Changchun University of Science and Technology
    University of Bedfordshire
    Issue Date
    2017-02-22
    Subjects
    magnetic probe cleaning
    magnetic contamination
    biaxially-oriented polypropylene film
    magnetic field
    magnetic force microscope
    
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    Abstract
    When magnetic samples are tested with a magnetic force microscope (MFM), the probe tip can inevitably be contaminated and magnetic particles are often adhered to the tip surface. The probe with magnetic contamination will seriously affect the quality of morphological and magnetic imaging. In the work, a method for the cleaning of contaminated magnetic probe tips was developed by the use of a biaxially-oriented polypropylene (BOPP) film together with an external magnet field in an MFM system. In the experiments, an MFM system was used for manipulating the tip to push into the BOPP film with a depth of 50-100nm under a magnetic field and hold for 5s, and the relationships between loading forces and separating forces were studied. The scanning electron microscope (SEM) images have shown that the use of the BOPP film together with an external magnet field is effective for the cleaning of contaminated MFM probes. This method can greatly improve the quality of magnetic imaging, prolong the service life of magnetic probes and reduce the experimental costs in many MFM applications.
    Citation
    Zhang C, Liu J, Meng Q, Zhang W, Wang Y, Li D, Wang Z (2017) 'Cleaning of contaminated MFM probes using a BOPP film and external magnetic field', Micron, 97, pp.1-5.
    Publisher
    Elsevier
    Journal
    Micron
    URI
    http://hdl.handle.net/10547/623846
    DOI
    10.1016/j.micron.2017.02.006
    PubMed ID
    28288343
    Additional Links
    https://www.sciencedirect.com/science/article/pii/S096843281630258X
    Type
    Article
    Language
    en
    ISSN
    0968-4328
    EISSN
    1878-4291
    ae974a485f413a2113503eed53cd6c53
    10.1016/j.micron.2017.02.006
    Scopus Count
    Collections
    Computing

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