Self-repair behaviour of the neuronal cell membrane by conductive atomic force indentation
Authors
Liu, CaijunHan, Xueyan
Yang, Xueying
Tian, Liguo
Wang, Ying
Wang, Xinyue
Yang, Huanzhou
Ge, Zenghui
Hu, Cuihua
Liu, Chuanzhi
Song, Zhengxun
Weng, Zhankun
Wang, Zuobin
Issue Date
2019-09-04Subjects
biomembranesatomic force microscope
atomic force microscopy
neurophysiology
cellular biophysics
C130 Cell Biology
Metadata
Show full item recordAbstract
Conductive atomic force indentation (CAFI) was proposed to study the self-repair behaviour of the neuronal cell membrane here. CAFI was used to detect the changes of membrane potentials by performing the mechanical indentation on neurons with a conductive atomic force microscope. In the experiment, a special insulation treatment was made on the conductive probe, which turned out to be a conductive nanoelectrode, to implement the CAFI function. The mechanical properties of the neuronal cell membrane surface were tested and the membrane potential changes of neurons cultured in vitro were detected. The self-repair behaviour of the neuronal cell membrane after being punctured was investigated. The experiment results show that CAFI provides a new way for the study of self-repair behaviours of neuronal cell membranes and mechanical and electrical properties of living cells.Citation
Liu C, Han X, Yang X,Tian L, Wang Y, Wang X, Yang H, Ge Z, Hu C, Liu C, Song Z, Weng Z, Wang Z (2019) 'Self-repair behaviour of the neuronal cell membrane by conductive atomic force indentation', IET Nanobiotechnology, 13 (9), pp.891-895.Journal
IET NanobiotechnologyPubMed ID
31811756Type
ArticleLanguage
enISSN
1751-875XEISSN
1751-875Xae974a485f413a2113503eed53cd6c53
10.1049/iet-nbt.2019.0123
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