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    Effect of pulse repetition rate on silicon wafer modification by four-beam laser interference

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    Authors
    Zhao, Le
    Wang, Zuobin
    Li, Wenjun
    Yu, M.
    Zhang, Z
    Xu, J.
    Yu, Y.
    Weng, Z.
    Li, S
    Maple, Carsten
    Li, D.
    Yue, Y.
    Show allShow less
    Affiliation
    Changchun University of Science and Technology
    University of Bedfordshire
    Issue Date
    2013-08
    Subjects
    laser interference
    lithography
    pulse repetition rate
    silicon wafer modification
    
    Metadata
    Show full item record
    Abstract
    This paper discusses the effect of pulse repetition rates on silicon wafer modification by four-beam laser interference. In the work, four-beam laser interference was used to pattern single crystal silicon wafers for the fabrication of dots, and different laser pulse repetition rates were applied to the process in the air. The results were obtained from 10 laser exposure pulses with the single laser fluence of 283mJ/cm2, the pulse repetition rates were 1Hz, 5Hz and 10Hz, the laser wavelength was 1064nm and the pulse duration 7-9ns. The results have been observed using a scanning electron microscope (SEM) and optical microscope. They indicate that the laser pulse repetition rate has to be properly selected for the fabrication of the structures of dots using four-beam laser interference.
    Citation
    Zhao, L., Wang, Z., Li, W., Yu, M., Zhang, Z., Xu, J., Yu, Y., Weng, Z., Li, S., Maple, C., Li, D., Yue, Y., (2013) "Effect of pulse repetition rate on silicon wafer modification by four-beam laser interference," Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2013 International Conference on , Suzhou, China, 26-30 August.
    Publisher
    IEEE
    URI
    http://hdl.handle.net/10547/336165
    DOI
    10.1109/3M-NANO.2013.6737385
    Additional Links
    http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6737385
    Type
    Conference papers, meetings and proceedings
    Language
    en
    ISBN
    9781479912100
    Sponsors
    This work was supported by National Key Basic Research Program of China (973 Program No.2012CB326406), Special Development Program of Central Financial Support to Local Universities (No.2011-183), EU FP7 (LaserNaMiNo.247644; ECNANOMAN No.269219), International Science and Technology Cooperation Program of China (No.2012DFA11070), National Natural Science Foundation Program of China (No.60940035 and No.61176002), Doctoral Program of Higher Education of China (No.20112216110002), Jilin Provincial Science and Technology Program (No.20100703, No.201024, No.201115157, No.20090401, No.20110704 and No.20100703), Guangdong Science and Technology Program (No.2009B091300 006 and No.2011B010700101), Science and Technology Program of Changchun City (No.09GH07 and No.11KP04), and Program of Changchun University of Science and Tech nology (No.129666 and No.XJJLG201101).
    ae974a485f413a2113503eed53cd6c53
    10.1109/3M-NANO.2013.6737385
    Scopus Count
    Collections
    Centre for Research in Distributed Technologies (CREDIT)

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