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dc.contributor.authorWang, Chaoen_GB
dc.contributor.authorSun, Lifengen_GB
dc.contributor.authorCui, Pengen_GB
dc.contributor.authorZhang, Jianweien_GB
dc.contributor.authorYang, Shiqiangen_GB
dc.date.accessioned2012-05-16T11:32:34Z
dc.date.available2012-05-16T11:32:34Z
dc.date.issued2012
dc.identifier.citationAnalyzing Image Deblurring Through Three Paradigms 2012, 21 (1):115-129 IEEE Transactions on Image Processingen_GB
dc.identifier.issn1057-7149
dc.identifier.issn1941-0042
dc.identifier.doi10.1109/TIP.2011.2159985
dc.identifier.urihttp://hdl.handle.net/10547/224103
dc.language.isoenen
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_GB
dc.relation.urlhttp://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=5893941en_GB
dc.rightsArchived with thanks to IEEE Transactions on Image Processingen_GB
dc.subjectBayesian methodsen
dc.subjectelectric shocken
dc.subjectimage edge detectionen
dc.subjectimage restorationen
dc.subjectkernelen
dc.subjectnoiseen
dc.subjecttinen
dc.subjectBayes methodsen
dc.subjectestimation theoryen
dc.subjectfiltering theoryen
dc.subjectimage restorationen
dc.subjectBayesian estimationen_GB
dc.subjectconjunctive deblurring algorithmen
dc.subjectdeterministic filteren
dc.subjectimage deblurringen
dc.subjectlimitation latenten
dc.titleAnalyzing image deblurring through three paradigmsen
dc.typeArticleen
dc.identifier.journalIEEE Transactions on Image Processingen_GB


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