2.50
Hdl Handle:
http://hdl.handle.net/10547/297905
Title:
Alignment method with application to gas chromatography / mass spectrometry screening
Authors:
Hitchcock, Jonathan James; Li, Dayou; Maple, Carsten; Keech, Malcolm
Abstract:
The paper presents a new spectrum-based alignment method that is able to precisely adjust the retention times of Gas Chromatography / Mass Spectrometry data so that corresponding scans of two samples can be chosen for comparison purposes. It includes the ability to do precise alignment within fractions of a scan; this is equivalent to doing sub-pixel registration of images.
Citation:
Hitchcock, J., Li, D., Maple, C., Keech, M. (2012) "Alignment Method with Application to Gas Chromatography / Mass Spectrometry Screening," 18th International Conference on Automation and Computing (ICAC), 8 Sep 2012
Publisher:
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date:
8-Sep-2012
URI:
http://hdl.handle.net/10547/297905
Additional Links:
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6330513
Type:
Conference papers, meetings and proceedings
Language:
en
ISBN:
9781467317221
Appears in Collections:
Centre for Research in Distributed Technologies (CREDIT)

Full metadata record

DC FieldValue Language
dc.contributor.authorHitchcock, Jonathan Jamesen_GB
dc.contributor.authorLi, Dayouen_GB
dc.contributor.authorMaple, Carstenen_GB
dc.contributor.authorKeech, Malcolmen_GB
dc.date.accessioned2013-08-12T08:30:32Z-
dc.date.available2013-08-12T08:30:32Z-
dc.date.issued2012-09-08-
dc.identifier.citationHitchcock, J., Li, D., Maple, C., Keech, M. (2012) "Alignment Method with Application to Gas Chromatography / Mass Spectrometry Screening," 18th International Conference on Automation and Computing (ICAC), 8 Sep 2012en_GB
dc.identifier.isbn9781467317221-
dc.identifier.urihttp://hdl.handle.net/10547/297905-
dc.description.abstractThe paper presents a new spectrum-based alignment method that is able to precisely adjust the retention times of Gas Chromatography / Mass Spectrometry data so that corresponding scans of two samples can be chosen for comparison purposes. It includes the ability to do precise alignment within fractions of a scan; this is equivalent to doing sub-pixel registration of images.en_GB
dc.language.isoenen
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_GB
dc.relation.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6330513en_GB
dc.subjectGC/MSen_GB
dc.subjectsub-pixel registrationen_GB
dc.titleAlignment method with application to gas chromatography / mass spectrometry screeningen
dc.typeConference papers, meetings and proceedingsen
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