2.50
Hdl Handle:
http://hdl.handle.net/10547/272040
Title:
The Weibull–lognormal fading channel: analysis, simulation, and validation
Authors:
Karadimas, Petros; Kotsopoulos, Stavros A.
Abstract:
In frequency-nonselective fading channels, the partial waves arriving at the mobile receiver cannot explicitly be of homogeneous nature due to nonuniform scattering caused by objects of specific reflective nature. Moreover, shadowing influences the received signal level by causing slow variations to its local mean. In this paper, we investigate a mixture stochastic process accounting for both inhomogeneous scattering and shadow fading by multiplying a Weibull process with a lognormal process. The first process models the possible scattering nonuniformities of the channel, whereas the second process accounts for the slow-term variations of the local mean due to shadowing. An exact solution for the composite probability density function (pdf) will be given, together with approximate solutions for the second-order statistics, i.e., the level crossing rate (LCR) and the average duration of fades (ADF). The approximate solutions come from the assumption of a slowly time-varying lognormal process compared with the Weibull process, the validity of which will be tested via an efficient deterministic simulation scheme that implements the analytical model on a digital computer. Finally, a curve fitting of the LCR to real-world data drawn from channel measurements will demonstrate the flexibility and usefulness of the proposed model.
Affiliation:
Department of Electrical and Computer Engineering, University of Patras, Greece
Citation:
Karadimas, P., Kotsopoulos, S.A., (2009) 'The Weibull–Lognormal Fading Channel: Analysis, Simulation, and Validation' IEEE Transactions on Vehicular Technology 58 (7):3808-3813
Publisher:
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Journal:
IEEE Transactions on Vehicular Technology
Issue Date:
2009
URI:
http://hdl.handle.net/10547/272040
DOI:
10.1109/TVT.2008.2002697
Additional Links:
http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=4579736
Type:
Article
Language:
en
ISSN:
0018-9545; 1939-9359
Appears in Collections:
Centre for Wireless Research (CWR)

Full metadata record

DC FieldValue Language
dc.contributor.authorKaradimas, Petrosen_GB
dc.contributor.authorKotsopoulos, Stavros A.en_GB
dc.date.accessioned2013-03-13T13:03:20Z-
dc.date.available2013-03-13T13:03:20Z-
dc.date.issued2009-
dc.identifier.citationKaradimas, P., Kotsopoulos, S.A., (2009) 'The Weibull–Lognormal Fading Channel: Analysis, Simulation, and Validation' IEEE Transactions on Vehicular Technology 58 (7):3808-3813en_GB
dc.identifier.issn0018-9545-
dc.identifier.issn1939-9359-
dc.identifier.doi10.1109/TVT.2008.2002697-
dc.identifier.urihttp://hdl.handle.net/10547/272040-
dc.description.abstractIn frequency-nonselective fading channels, the partial waves arriving at the mobile receiver cannot explicitly be of homogeneous nature due to nonuniform scattering caused by objects of specific reflective nature. Moreover, shadowing influences the received signal level by causing slow variations to its local mean. In this paper, we investigate a mixture stochastic process accounting for both inhomogeneous scattering and shadow fading by multiplying a Weibull process with a lognormal process. The first process models the possible scattering nonuniformities of the channel, whereas the second process accounts for the slow-term variations of the local mean due to shadowing. An exact solution for the composite probability density function (pdf) will be given, together with approximate solutions for the second-order statistics, i.e., the level crossing rate (LCR) and the average duration of fades (ADF). The approximate solutions come from the assumption of a slowly time-varying lognormal process compared with the Weibull process, the validity of which will be tested via an efficient deterministic simulation scheme that implements the analytical model on a digital computer. Finally, a curve fitting of the LCR to real-world data drawn from channel measurements will demonstrate the flexibility and usefulness of the proposed model.en_GB
dc.language.isoenen
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_GB
dc.relation.urlhttp://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=4579736en_GB
dc.rightsArchived with thanks to IEEE Transactions on Vehicular Technologyen_GB
dc.subjectfading channelsen_GB
dc.subjectnonuniform scatteringen_GB
dc.subjectSuzuki processen_GB
dc.subjectWeibull fadingen_GB
dc.subjectshadowingen_GB
dc.subjectfading channelsen_GB
dc.titleThe Weibull–lognormal fading channel: analysis, simulation, and validationen
dc.typeArticleen
dc.contributor.departmentDepartment of Electrical and Computer Engineering, University of Patras, Greeceen_GB
dc.identifier.journalIEEE Transactions on Vehicular Technologyen_GB
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